SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS) and KD, Inc., a fabless semiconductor company, have collaborated to create a comprehensive test for Multigigabit Optical ...
Anritsu presents automotive Ethernet test solution designed to support physical-layer compliance testing for networks.
There once was a time when the most sophisticated electronic testing instrument for automobiles was the dwell meter. Well, needless to say—that was then. Today’s vehicles are rapidly become more ...
It’s a busy day for the automotive team of a tier-1 company. Engineers are rushing to complete the modules assigned to them so that the unit testing can be performed. The engineers are worried about ...
SANTA ROSA, Calif., October 14, 2025--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS) introduced the AE6980T nGBASE-AU Optical Automotive Ethernet Transmitter Test Solution, the industry’s ...
What's behind the IEEE 802.3cz Multi-Gigabit Glass Optical Fiber Automotive Ethernet standard. Optical vs. electrical links in automotive Ethernet. Details behind various compliance and conformance ...
Rohde & Schwarz expands testing for automotive systems that employ Analog Devices’ Gigabit Multimedia Serial Link (GMSL) technology. Designed to enhance high-speed video links in applications like ...
Dynamic signal analyzers are increasingly used to evaluate frequency response, vibration, and acoustic behavior in both ...
AUSTIN, Texas--(BUSINESS WIRE)--NI (Nasdaq:NATI), the provider of platform-based systems that enable engineers and scientists to solve the world’s greatest engineering challenges, announced today a ...
Interconnect cables play an important role in electronics testing. As high-speed signal communications continue to advance, cabling solutions will need to keep up with high-speed, multiport testing.
When it comes to testing microelectromechanical system devices and sensors, sometimes you have to shake and bake. and sensors are physically different from standard ICs. They require a specific type ...
Design for test is becoming enormously more challenging at advanced nodes and in increasingly heterogeneous designs, where there may be dozens of different processing elements and memories.
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