Production test of a finished electronic product often involves two techniques: in-circuit test (ICT) and functional component test (FCT). The ICT technique examines a non-powered circuit board to ...
In-circuit test (ICT) has been instrumental in identifying manufacturing process defects and component defects on countless varieties of populated printed circuit board (PCB) assemblies for more than ...
According to Siemens, the acquisition will allow it to integrate Aster's circuit-testing capabilities into its own portfolio.
JTAG has its place but it is not by any means the total solution. Boundary scan, as standardized by IEEE 1149.1 and commonly referred to as JTAG, has truly revolutionized the testability of circuit ...
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